This study presents high-resolution electrochemical mapping of HOPG, revealing nanoscale variations in electrochemical activity across basal planes.

Atomic Force Microscopy plays a crucial role in semiconductor failure analysis, addressing challenges in defect inspection ...

Engineered for versatility, the FX200 AFM combines automation and precision, streamlining large-sample imaging for both ...

State Key Laboratory of Chemo/Biosensing and Chemometrics, College of Chemistry and Chemical Engineering, Biomedical Engineering Center, Key Laboratory for Bio-Nanotechnology and Molecular Engineering ...

† Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, 230026, P. R. China ‡ i-Lab, Suzhou Institute of Nano-Tech and Nano-Bionics, ...

PiFM combines atomic force microscopy with chemical imaging, offering insights into molecular orientation and surface ...

Abstract: We present new insights into the modeling of the microcantilever in dynamic mode atomic force microscopy and outline a novel high-bandwidth tip-sample force estimation technique for the ...